Department of Optoelectronics and Electronic Systems (OiSE) was created in 2006 by merger of the Department of Optoelectronics and the Department of Metrology and Electronic Systems. Department of Optoelectronics was established in 1992 from the Optoelectronics Laboratory of the Institute of Electronic Technology directed by prof. dr h.c. Henryk Wierzba, D.Sc., E.E., and following, from 1993, by  . Department of Metrology and Electronic Systems was created in 2003 by integrating Department of Measurement Equipment ( prof. Ludwik Spiralski D.Sc. E.E. ) and Department of Electronic Metrology ( prof. Romuald Zielonko D.Sc., E.E. ). prof. Bogdan Kosmowski, D.Sc., E.E.

Department of Optoelectronics and Electronic Systems offers two diploma profiles (on B.Sc. studies) and two specializations (on M.Sc. studies):

• Optoelectronics  

• Computer Electronic Systems

The program of study offered by the Department research groups covers an extensive range of basic and advanced knowledge and skills:-In the Optoelectronics Research Group the key subjects are:  

• Material science/engineering ,
• Optoelectronics ,
• Optoelectronic equipment and systems ,
• Laser technique ,
• Information visualization systems ,
• Modern optical fiber telecommunication systems ,
• Optical information processing and holgraphy ,
• Computer-aided electronic circuit design ,
• Creative leadership and innovative solving of engineering problems.

- In the Metrology and Electronic Systems Group offered courses include:

• Metrology and experiments techniques ,
• Design methodology and manufacturing ,
• Numerical methods ,
• Interfaces of electronic systems ,
• Microcontrollers and microsystems ,
• Digital signal processors ,
• Electromagnetic compatibility ,
• Electronic infosystems ,
• Organization and programming of electronic systems .

Scientific research conducted by the research teams of the Department is focused on the development of innovative methods of acquiring, processing and visualization of information.
In the Optoelectronics Group, the research covers the application of advanced optoelectronic measurement methods for monitoring technical objects and environment. Research topics are:

• Applications of optoelectronic measurement and diagnostic methods in science, engineering, medicine and ecology,
• Modeling and implementation of optical fiber sensors,
• Investigation of technical objects using non-invasive optical methods (Optical Coherence Tomography),
• Investigation and optimization of color Liquid Crystal Displays,
• Material science: synthesis, investigation and application of innovative thin film materials (Diamond, Diamond-Like Carbon) and ceramics (PLZT), physical and chemical methods for deposition of thin films for optoelectronics and microelectronics (PVD and CVD),
• Spectrophotometric measurement methods for investigation of materials and technological processes,
• Optoelectronic systems for support of the visually impaired,
• Computer-aided design and analysis of electronic circuits.

Research topics of the Metrology and Electronic Systems Group are:

• Metrology and computer-aided diagnostics,
• Impedance measurement and impedance spectroscopy, telemetry and remote monitoring,
• Design of electronic systems, microsystems and macrosystems,
• Automated test and diagnostics of electronic components and systems,
• Measurement of noise characteristics of components and systems, electromagnetic interference and disturbance in electronic circuits and systems,
• Reliability of electronic components, subassemblies and circuits,
• Electromagnetic compatibility.

The research has been conducted in the framework of several projects financed by the Polish Ministry of the Scientific Research and Information Technology (MSRIT), international research projects (POLECER, TEMPUS), direct multilateral international cooperation as well as in cooperation with the business sector of the Pomeranian Region. Research groups in the Department maintain a broad international cooperation in the fields of research and education with several renowned research centers. The key partners are: University of Oulu (Finland), VTT Technical Research Centre of Finland; University of Karsluhe (Germany), University of Stuttgart (Germany), University of Rostock (Germany), University of Greifswald (Germany), TU Berlin (Germany), TU Paderborn (Germany), Uppsala University (Sweden), University of Teras A&M (USA), ENSERG (Grenoble, France), University of Trento (Italy).

The staff of Department of Optoelectronics and Electronic Systems continually improves its academic qualifications and research skills, earning scientific degrees and titles . For outstanding research achievements, the research teams from the Department have also received several awards the of the Rector of the Gdańsk University of Technology. The Team of Computer-Controlled Measurement and Diagnostic Systems was awarded the Special Prize on the 6^th International Invention Fair (INNOWACJE 2005) for a high-impedance spectroscopy analyzer of anti-corrosion layers developed in the framework of an EUREKA project E!3174-HIADAC. Two international patents covering the operation of this analyzer were issued in Sweden and in the USA.

Dr Marcin Gnyba has received the IMEKO György Striker Junior Paper Award for the best paper on XVII IMEKO World Congress as well as an award of the LOTOS group for an outstanding doctoral thesis.Innovative technology of manufacturing and testing of SiC semiconductor components is the topic of a Polish Ministry of the Scientific Research and Information Technology research project in which one of the research teams directed by prof. Alicja Konczakowska is involved.

Scientific achievements of the Computerized Measurement and Diagnostic Systems Group are highly valued by the Polish and international research community. In recognition of it, prof. Romuald Zielonko has been appointed as the editor of the Polish Academy of Sciences peer-reviewed journal „Metrology and Measurement Systems”.

Research groups from the Department of Optoelectronics and Electronic Systems have organized or participated in the organization of national and international conferences (ECOM-03, Computer-Aided Metrology, NOISE 2000, Seminary on the Random Signal Measurement, COE).
Currently, research groups in the Department of Optoelectronics and Electronic Systems work on original research programs that focus on:

• application of Optical Coherence Tomography for investigation of the properties of stratified media,
• diagnostics of noise properties and reliability of the structures of electronic components made from SiC,
• impedance spectroscopy of technical objects having extreme values of characteristic parameters.

Researchers working in the Department are active members of Polish and international professional societies, such as SPIE, PTTS, IEEE, PTETiS, SHP, OSA, Polish Academy of Science – Committee of Metrology and Scientific Equipment, IMEKO TC-10, POLSPAR.