• Applications of optoelectronic measurement and diagnostic methods in science, engineering, medicine and ecology,  
• Modeling and implementation of optical fiber sensors,  
• Investigation of technical objects using non-invasive optical methods (Optical Coherence Tomography),  
• Investigation and optimization of color Liquid Crystal Displays,  
• Material science: synthesis, investigation and application of innovative thin film materials (Diamond, Diamond-Like Carbon) and ceramics (PLZT), physical and chemical methods for deposition of thin films for optoelectronics and microelectronics (PVD and CVD),  
• Spectrophotometric measurement methods for investigation of materials and technological processes,  
• Optoelectronic systems for support of the visually impaired,  
• Computer-aided design and analysis of electronic circuits.  

Research topics of the Metrology and Electronic Systems Group are:  

• Metrology and computer-aided diagnostics,  
• Impedance measurement and impedance spectroscopy, telemetry and remote monitoring,  
• Design of electronic systems, microsystems and macrosystems,  
• Automated test and diagnostics of electronic components and systems,  
• Measurement of noise characteristics of components and systems, electromagnetic interference and disturbance in electronic circuits and systems,  
• Reliability of electronic components, subassemblies and circuits,  
• Electromagnetic compatibility.

Publications 2007

Pub lications 2006

Pub lications 2005

Pub lications 2004

Pub lications 2003